News

Director of National Institute of Standards and Technology (NIST) Visited NIM
Release date: July 19, 2019 A few days ago, Dr. Walter G. Copan, U.S. Under Secretary of Commerce for Standards and Technology and NIST Director, Dr. James K. Olthoff, Associate Director of NIST,…
Vice Director of the International Bureau of Legal Metrology (BIML) Visited NIM
Release date: July 18, 2019 Paul Dixon, Vice Director of BIML visited the OIML Issuing Authority at NIM on July 12 to have an amicable meeting with Fang Xiang, Director of NIM in connection with the…
The 11th Science & Technology Committee of NIM Founded
Release date: May 27, 2019 On May 22, the 11th Science & Technology Committee of NIM was founded at Changping campus. More than 80 people, including Fang Xiang, Duan Yuning, Wu Fangdi, Song…
The World Metrology Day 2019 Activity Held in Beijing and the New Definitions of the SI Base Units Formally Implemented in China
On May 20, the 20th World Metrology Day, nearly 500 Chinese and foreign guests, academicians, experts and scholars in the metrology field gathered in the China Hall of Science and Technology in…