As electromagnetic research, the precision measurement of electric field intensity based on quantum effect has become an important basis for exploring new electromagnetic effects. This effect also has great potential for its applications in new materials, micro-nano devices and chip performance research. The classical microwave electric field metrology basing on the standard probe or standard field, is no longer able to fully satisfy those cutting-edge application demands, due to its limitation in sensitivity and spatial resolution.
Therefore, NIM has been committed to developing quantum E-field measurement method and standard using the quantum coherence effects in highly-excited Rydberg atoms. Based on the self-developed low disturbance minimized microwave E-field quantum sensor, NIM has successfully realized the high-sensitivity and broadband microwave E-field measurement, which can be directly traceable to the Planck constant. The uncertainty of measurement at typical frequencies is one magnitude better than the traditional method.