Division of Nano Merology and Materials Measurement

Division of Nano Merology and Materials Measurement

Overview

The division is responsible for developing, maintaining and disseminating national measurement standards and certified reference materials (CRMs) for nano metrology, advanced material measurement and physical chemistry. It also undertakes assessment work for measurement institutions, proposing measurement methods and evaluating measured results.

Director's Greeting

News and Events

  • Project: Fullerene Measurement in Raman Spectrum is Concluded

    Project: Fullerene Measurement in Raman Spectrum is honored with a third prize CAIA award by China Association for Instrument Analysis (CAIA). It is the first time a research group using Raman spectrum to measure fingerprint spectrum of embedded f...

  • Division of Nano Metrology and Materials Measurement Attends the 20th IMEKO World Congress

    The Division Attended the 20th IMEKO World Congress. The theme of the Congress is Metrology for Green Growth, and special sessions on nano metrology and green metrology were included. Two oral reports were presented at the conference introducing t...

  • CIPM Member Visits the Division

    CIPM committee member Dr. Kim da Costa Carneiro visited Division of Nano Metrology and Advanced Materials Measurements on 20 Sep, 2012. An cooperation project between NIM and Technical University of Denmark (DTU MEK) in surface roughness measureme...