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Address: No.18,Bei San Huan
Dong Lu,Chaoyang
Dist,Beijing,P.R.China, 100013

ws@nim.ac.cn
Tel:+86-10-64525678

 

Div. of Nano Metrology and Materials Measurement

 


No.

Author

Title

Publication Year

Conference / Journals & Magazines, Volume(Issue)

Page(s)

1

Gao Sitian,

Lu Mingzhen,

Li Wei

A large range metrological atomic force microscope with nanometer uncertainty

2012

XX IMEKO World Congress, Busan

 

2

Gao Sitian,

Lu Mingzhen,

Li Wei

Metrological atomic force microscope and application in step height measurement

2012

XX IMEKO World Congress, Busan

 

3

Shi Yushu

Verification of the numerical aperture of laser scanning confocal microscope objective

2012

The 6th SPIE International Symposium on 

Advanced Optical Manufacturing and Testing Technologies

 

4

Wang Haifeng,

Li Jia,

Sun Guohua

Rapid instrumental method for the content of carbon, hydrogen and nitrogen of solid biomass

2012

The 6th World Bioenergy Symposium

 

5

Liu Junjie,

Zhang Wenge

Nanoparticle size measurement by nanoparticle tracking analysis (NTA) method

2012

XX IMEKO world congress metrology for green growth

 

6

Wang Haifeng

Certification of the reference material of water content in water saturated 1-octanol by Karl Fischer coulometry, Karl Fischer volumetry and quantitative nuclear magnetic resonance

2012

Food Chemistry

UT  WOS:000305859800087

 

7

Wang Haifeng

Production of three certified reference materials for water content based on mixed solutions of butanol, xylene and propylene carbonate

2012

Accreditation and Quality Assurance

UT  WOS:000311199500003

 

8

Ren Lingling,

Gao Huifang

Effects of Growth Conditions on the GaAs/AlAs Superlattices by Grazing Incidence X-Ray Reflectivity

2013

Journal of Nanoscience
and Nanotechnology, Volume 13, Number 2,(5)

761-765