UTC(NIM)

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Contact Us

General Information:

Address: No.18,Bei San Huan
Dong Lu,Chaoyang
Dist,Beijing,P.R.China, 100013

ws@nim.ac.cn
Tel:+86-10-64525678

 

Length

 

Sub-No

Field

Comparison inentifier

Description

Start Year

Finish Year

Comparison type

Field

Parameter(s)/Measured

Status

Pilot

Publish Year

1

L

  APMP.L- K1

Gauge blocks by interferometry

2001

2002

K

 Length, Dimensional Metrology

 

Approved for equivalence, Results available

NMIJ

2006

2

L

  APMP.L- K11

Comparison of primary wavelength standards

2004

2004

K

 Length, Laser Frequencies

633 nm

Approved for equivalence, Results available

NIM

 

3

L

  APMP.L- K2

Long gauge blocks from 200 to 500 mm

2000

2002

K

 Length, Dimensional Metrology

 

Approved for equivalence, Results available

NMIA

2006

4

L

  APMP.L- K3

Calibration of angle standards

2005

2007

K

 Length, Dimensional Metrology

 

Report in progress, Draft B

NMISA

 

5

L

  APMP.L- K5.2006

Step gauge

2006

2007

K

 Length, Dimensional Metrology

 

Approved for equivalence

KRISS

 

6

L

  APMP.L- K6

Two-dimensional coordinate measuring machine artefacts

2006

2008

K

 Length, Dimensional Metrology

 

Report in progress, Draft B

NMIJ

 

7

L

  APMP.L- K8

Surface texture

 

 

K

 Length, Dimensional Metrology

 

Report in progress, Draft B

NMIA

 

8

L

  BIPM.L- K10

Comparison of the frequencies of Helium-Neon lasers at wavelength 633 nm

1988

2000

K

Length, Laser Frequencies

 

Approved for equivalence, Results available

BIPM

 

9

L

  BIPM.L- K11

Comparison of primary wavelength standards

2004

2006

K

 Length, Laser Frequencies

633 nm and 543 nm

Approved for equivalence, Results available

NIM

2007

10

L

  CCL- K1

Gauge blocks by interferometry

1998

1999

K

 Length, Dimensional Metrology

Steel and tungsten carbide materials

Approved for equivalence, Results available

METAS

 

11

L

  CCL- K2

Long gauge blocks by interferometry

1999

2001

K

 Length, Dimensional Metrology

 

Approved for equivalence, Results available

NPL

 

12

L

  CCL- K3

Angle standards

2000

2002

K

 Length, Dimensional Metrology

 

Approved for equivalence, Results available

NMISA

2008

13

L

  CCL- K4.a

Diameter standards

2000

2002

K

 Length, Dimensional Metrology

Internal diameter

Approved for equivalence, Results available

NIST

2007

14

L

  CCL- K4.b

Diameter standards

2000

2002

K

 Length, Dimensional Metrology

External diameter

Approved for equivalence, Results available

NIST

2007

15

L

  CCL- K5

One-dimensional coordinate measuring machine artefacts

1999

2002

K

 Length, Dimensional Metrology

Step gauge and ball bars

Approved for equivalence, Results available

PTB

2006

16

L

  CCL- K6

Two-dimensional coordinate measuring machine artefacts

2000

2003

K

 Length, Dimensional Metrology

 

Approved for equivalence, Results available

CENAM

2008

17

L

  CCL- S1

Nanometrology: one-dimensional gratings

1999

2000

S

 Length, Dimensional Metrology

Pitch of gratings: 290 nm and 700 nm

Approved and published, Results available

METAS

 

18

L

  CCL- S2

Nanometrology: step height standards

2000

2002

S

 Length, Dimensional Metrology

Step height: between 7 nm and 800 nm

Approved and published

PTB

 

19

L

  CCL- S3

Nanometrology: line scale standards

2000

2002

S

 Length, Dimensional Metrology

Line structure: 4 µm width, 1 mm length

Approved and published

PTB

 

20

L

  CCL- S4

Nanometrology: two-dimensional gratings

1998

2000

S

Length, Dimensional Metrology

Pitch: 300 nm and 1000 nm
Angle: 90°

 Approved and published

DFM

2008

21

L

  EUROMET.L- K7.2006

Linescales

2006

2008

K

 Length, Dimensional Metrology

Length smaller or equal to 100 mm

Approved for equivalence, Results available

MIRS/UM-FS/LTM

 

22

L

  SIM.L- S3.PREV

Measurement of Rockwell hardness indenter geometry

1998

1998

S

 Length, Dimensional Metrology

 

Published

NIST

 

23

L

EURAMET.L- K3.2009

Angle comparison using an autocollimator

2009

2012

K

Length, Dimensional Metrology

 

In progress

PTB

 

24

L

CCL- K1.2011

Calibration by optical Interferometry of short and long gauge blocks

2011

2012

K

 Length, Dimensional

Central length from 0.5 mm to 508 mm

In progress

CENAM/NRC

 

25

L

CCL-K11

Comparison of optical frequency and wavelength standards

2008

/

K

Length, Laser Frequencies

Absolute frequency of the reference component of the corresponding recommended radiation for the practical realization of the definition of the metre

Ongoing

BEVMIKESNIMJNPLNRC

 

26

L

APMP.L- S4

 Geometrical roundness measurements using error separation 

2012

2013

S

 Length, Dimensional Metrology

 

In progress

NMITNMIJ

 

27

L

APMP.L- S5

Nano particles measurements

2012

 

S

Length, Dimensional Metrology

10 nm, 20 nm, 30 nm, 100 nm, and 300 nm

In progress

CMSNMIJ